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AW37103D070ADNR

데이터 시트 :

제품 상세 정보

매개변수

Load Current (Max) (mA)	300
Power Supply (Min) (V)	1.2
Power Supply (Max) (V)	5.5
Vout (Min) (V)	0.7
Vout (Max) (V)	3.3
Iq (Typ) (μA)	2
Vdropout (mV)	320(VOUT=1.8V) 203(VOUT=2.8V) 187(VOUT=3.0V) 179(VOUT=3.3V)
PSRR @1KHz(dB)	75@IOUT=30mA
Output Noise (μVrms)	50(VOUT=0.8V) 60(VOUT=1.8V) 80(VOUT=2.8V) 84(VOUT=3.0V) 90(VOUT=3.3V)
Discharge	YES
Output options	Fixed ADJ
Temperature	-40℃~85℃
IO Level (V)	1.8
Package (mm)	DFN 2X2-6L

패키지 | 핀 | 크기

WBDFN 2X2-6L(0.75)

특징

 Input voltage range: 1.2V to 5.5V  Fixed outputs of 0.7V, 0.8V, 0.9V, 1.0V, 1.05V, 1.2V, 1.5V, 1.8V, 2.5V, 2.8V, 3.0V, 3.3V  Rated output current: 300mA  Quiescent current: typical 2uA  Typical 0.1uA shutdown current  Typical 320mV dropout voltage (IOUT=300mA, 1.8V output)  Power supply rejection ratio: typical 75dB (IOUT=30mA, freq=1kHz, 1.8V output)  Noise: typical 60uVrms (IOUT=30mA, BW=10Hz to 100kHz, 1.8V output)  Built-in output short protection: typical 300mA when output short to ground  DFN 1mmX1mmX0.37mm-4L package, SOT 23-5L package and DFN 2mmX2mmX0.75mm-6L package.

기술 문서

	유형	제목		언어		날짜
	Product Design Guide	AW37103YXXX硬件设计指南		中文		2024-08-01
	Datasheet	DS_AW37103YXXX_EN_V2.3		英文		2024-11-08

설계 및 개발

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하드웨어 개발

평가 보드

AW37103YXXXADNR_EVB_V1.0 — AW37103YXXXADNR EVB is a low IQ test board，the main test points of the chip are drawn separately on the EVB board for convenient testing

EVB evaluation board for LDO AW37283BXXXSPR-Q1

옵션 보기

평가 보드

AW3705DXXXDNR EVB V2.0 — The AW3705DXXXDNR EVB is a low-IQ LDO test board developed by AWINIC. All key test points of the chip are individually routed out on the EVB for convenient measurement.

EVB Evaluation Board for LDO AW37102YXXXDNR/AW37103YXXXDNR

옵션 보기

하드웨어 개발

평가 보드

AW37103YXXXADNR_EVB_V1.0 — AW37103YXXXADNR EVB is a low IQ test board，the main test points of the chip are drawn separately on the EVB board for convenient testing

EVB evaluation board for LDO AW37283BXXXSPR-Q1

옵션 보기

평가 보드

AW3705DXXXDNR EVB V2.0 — The AW3705DXXXDNR EVB is a low-IQ LDO test board developed by AWINIC. All key test points of the chip are individually routed out on the EVB for convenient measurement.

EVB Evaluation Board for LDO AW37102YXXXDNR/AW37103YXXXDNR

옵션 보기